Substrate mapping - process for classifing semiconductor parts. Article "Substrate mapping" in English Wikipedia has 11.1 points for quality (as of July 1, 2025). The article contains 0 references and 3 sections.
Since the creation of article "Substrate mapping", its content was written by 6 registered users of English Wikipedia and edited by 6 registered Wikipedia users in all languages.
The article is cited 1 times in English Wikipedia and cited 1 times in all languages.
The highest Authors Interest rank from 2001:
The highest popularity rank from 2008:
There is 1 language version for this article in the WikiRank database (of the considered 55 Wikipedia language editions).
The quality and popularity assessment was based on Wikipédia dumps from July 1, 2025 (including revision history and pageviews for previous years).
| Best Rank | English: #1271815 04.2008 |
Global: #2086027 01.2008 |
| Best Rank | English: #330157 10.2006 |
Global: #549876 10.2006 |
On 12 August 2025 in multilingual Wikipedia, Internet users most often read articles on the following topics: Cristiano Ronaldo, Wednesday, Georgina Rodríguez, ChatGPT, Weapons, Jenna Ortega, deaths in 2025, Taylor Swift, Miguel Uribe Turbay, 2025–26 UEFA Champions League.
In English Wikipedia the most popular articles on that day were: Weapons (2025 film), Danielle Spencer (American actress), Cristiano Ronaldo, Deaths in 2025, Taylor Swift, Wednesday (TV series), Superman (2025 film), Georgina Rodríguez, Coolie (2025 film), The Fantastic Four: First Steps.
The WikiRank project is intended for automatic relative evaluation of the articles in the various language versions of Wikipedia. At the moment the service allows to compare over 44 million Wikipedia articles in 55 languages. Quality scores of articles are based on Wikipedia dumps from July, 2025. When calculating current popularity and AI of articles data from June 2025 was taken into account. For historical values of popularity and AI WikiRank used data from 2001 to 2025... More information
$$Quality=1/c∑↙{i=1}↖c nm_i-RS=1/5(5.32+0+28.57+21.43+0)$$
where:
The results of the calculations may be slightly different because of rounded values of normalized metrics in formulas
