Quality:

Wafer testing - step performed during semiconductor device fabrication by applying special test patterns to a wafer before it is sent to die preparation. Article "Assaig d'oblies" in Catalan Wikipedia has 19.4 points for quality (as of August 1, 2024).
The article contains 5 references and 1 sections.
In this language version of Wikipedia the article has the best quality. However, the most popular language version of this article is English.
Since the creation of article "Assaig d'oblies", its content was written by 2 registered users of Catalan Wikipedia and edited by 87 registered Wikipedia users in all languages.
The article is cited 2 times in Catalan Wikipedia and cited 54 times in all languages.
The highest Authors Interest rank from 2001:
- Local (Catalan): #3899 in November 2022
- Global: #134593 in October 2004
The highest popularity rank from 2008:
- Local (Catalan): #219511 in October 2023
- Global: #398436 in March 2015
There are 6 language versions for this article in the WikiRank database (of the considered 55 Wikipedia language editions).
The quality and popularity assessment was based on Wikipédia dumps from August 1, 2024 (including revision history and pageviews for previous years).
The table below shows the language versions of the article with the highest quality.