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Assaig d'oblies

Quality:
1

Wafer testing - step performed during semiconductor device fabrication by applying special test patterns to a wafer before it is sent to die preparation. Article "Assaig d'oblies" in Catalan Wikipedia has 19.4 points for quality (as of August 1, 2024). The article contains 5 references and 1 sections.

In this language version of Wikipedia the article has the best quality. However, the most popular language version of this article is English.

Since the creation of article "Assaig d'oblies", its content was written by 2 registered users of Catalan Wikipedia and edited by 87 registered Wikipedia users in all languages.

The article is cited 2 times in Catalan Wikipedia and cited 54 times in all languages.

The highest Authors Interest rank from 2001:

  • Local (Catalan): #3899 in November 2022
  • Global: #134593 in October 2004

The highest popularity rank from 2008:

  • Local (Catalan): #219511 in October 2023
  • Global: #398436 in March 2015

There are 6 language versions for this article in the WikiRank database (of the considered 55 Wikipedia language editions).

The quality and popularity assessment was based on Wikipédia dumps from August 1, 2024 (including revision history and pageviews for previous years).

The table below shows the language versions of the article with the highest quality.

Languages with the highest quality

#LanguageQuality gradeQuality score
1Catalan (ca)
Assaig d'oblies
19.3847
2Chinese (zh)
晶圆测试
18.6571
3Persian (fa)
آزمایش ویفر
17.3883
4English (en)
Wafer testing
15.6096
5Russian (ru)
Тестирование полупроводниковых пластин
13.6687
More...

The following table shows the most popular language versions of the article.

Most popular in all the time

The most popular language versions of the article "Assaig d'oblies" in all the time
#LanguagePopularity awardRelative popularity
1English (en)
Wafer testing
392 668
2Russian (ru)
Тестирование полупроводниковых пластин
28 020
3German (de)
Wafertest
26 203
4Persian (fa)
آزمایش ویفر
315
5Chinese (zh)
晶圆测试
64
More...

The following table shows the language versions of the article with the highest popularity in the last month.

Most popular in July 2024

The most popular language versions of the article "Assaig d'oblies" in July 2024
#LanguagePopularity awardRelative popularity
1English (en)
Wafer testing
1 176
2German (de)
Wafertest
100
3Chinese (zh)
晶圆测试
64
4Russian (ru)
Тестирование полупроводниковых пластин
55
5Persian (fa)
آزمایش ویفر
3
More...

The following table shows the language versions of the article with the highest Authors’ Interest.

The highest AI

Language versions of the article "Assaig d'oblies" with the highest Authors Interest (number of authors). Only registered Wikipedia users were taken into account.
#LanguageAI awardRelative AI
1English (en)
Wafer testing
49
2German (de)
Wafertest
20
3Russian (ru)
Тестирование полупроводниковых пластин
14
4Catalan (ca)
Assaig d'oblies
2
5Persian (fa)
آزمایش ویفر
1
More...

The following table shows the language versions of the article with the highest Authors’ Interest in the last month.

The highest AI in July 2024

Language versions of the article "Assaig d'oblies" with the highest AI in July 2024
#LanguageAI awardRelative AI
1Chinese (zh)
晶圆测试
1
2Catalan (ca)
Assaig d'oblies
0
3German (de)
Wafertest
0
4English (en)
Wafer testing
0
5Persian (fa)
آزمایش ویفر
0
More...

The following table shows the language versions of the article with the highest number of citations.

The highest CI

Language versions of the article "Assaig d'oblies" with the highest Citation Index (CI)
#LanguageCI awardRelative CI
1English (en)
Wafer testing
28
2Russian (ru)
Тестирование полупроводниковых пластин
12
3German (de)
Wafertest
6
4Chinese (zh)
晶圆测试
4
5Catalan (ca)
Assaig d'oblies
2
More...

Scores

Estimated value for Wikipedia:
Catalan:
Global:
Popularity in July 2024:
Catalan:
Global:
Popularity in all years:
Catalan:
Global:
Authors in July 2024:
Catalan:
Global:
Registered authors in all years:
Catalan:
Global:
Citations:
Catalan:
Global:

Quality measures

Interwikis

#LanguageValue
caCatalan
Assaig d'oblies
deGerman
Wafertest
enEnglish
Wafer testing
faPersian
آزمایش ویفر
ruRussian
Тестирование полупроводниковых пластин
zhChinese
晶圆测试

Popularity rank trends

Best Rank Catalan:
#219511
10.2023
Global:
#398436
03.2015

AI rank trends

Best Rank Catalan:
#3899
11.2022
Global:
#134593
10.2004

Local AI rank history

Languages comparison

Important global interconnections

Wikipedia readers most often find their way to information on Wafer testing from Wikipedia articles about Semiconductor device fabrication, Probe card, Die, Automatic test equipment and Integrated circuit. Whereas reading the article about Wafer testing people most often go to Wikipedia articles on Semiconductor device fabrication, Non-contact wafer testing, Die preparation, Probe card and Back end of line.

Cumulative results of quality and popularity of the Wikipedia article

List of Wikipedia articles in different languages (starting with the most popular):

News from 19 March 2025

On 19 March 2025 in multilingual Wikipedia, Internet users most often read articles on the following topics: assassination of John F. Kennedy, Adolescence, Elon Musk, Gal Gadot, John F. Kennedy, Incel, Sunita Williams, deaths in 2025, ChatGPT, March 19.

In Catalan Wikipedia the most popular articles on that day were: Diada de Sant Josep, Àlex Blanquer, Pere Lluís i Font, Ramon Mirabet, Sydney Schertenleib, Montse Germán, Lola Lolita, Adolescence, Sant Josep, Napoleó Bonaparte.

About WikiRank

The WikiRank project is intended for automatic relative evaluation of the articles in the various language versions of Wikipedia. At the moment the service allows to compare over 44 million Wikipedia articles in 55 languages. Quality scores of articles are based on Wikipedia dumps from August, 2024. When calculating current popularity and AI of articles data from July 2024 was taken into account. For historical values of popularity and AI WikiRank used data from 2001 to 2023... More information